Wide-Bandgap Device and Packaging Research

NREL, in partnership with graduate student fellows from Virginia Polytechnic Institute and State University (Virginia Tech), researched thermal and reliability aspects of wide-bandgap-based metal-oxide semiconductor field-effect transistors and packages and modules.

Researcher applying a liquid on a plate below lab equipment.

Researching thermal and reliability aspects of advanced wide-bandgap-based power modules, NREL collaborated with Virginia Tech to perform power cycling of emerging wide-bandgap devices.

Electrical precursor measurements taken during power cycling indicate reduction in performance from a new, healthy power module. These precursors change values when subjected to power cycling, and the change in precursor value predicts the remaining useful life of a module. This technique could be applied to other power electronic components beyond the power devices.

NREL advises the next generation of power electronics engineers on thermal and thermomechanical modeling and provides best practices on meshing, thermal finite element, and computational fluid dynamics modeling as well as other modeling aspects that directly benefit the participating graduate fellows.

The research supported the training of graduate students and the next generation of researchers with assistance from the U.S. Department of Energy's Advanced Materials and Manufacturing Technologies Office.

Students under this traineeship were exposed to experimental and modeling techniques. They helped build and conduct laboratory research experiments to investigate the reliability of advanced power electronics packaging strategies.


Beyond demonstrating the benefits of a collaboration between national laboratories and academia, this work helped improve power densities and optimize heterogeneous power module layouts through co-design of thermal and reliability aspects of power module development at an early stage, along with research on the electrical aspects.

Additionally, prognostics and health management techniques produced from this project could reduce costs and improve reliability for electric-drive vehicles as well as other energy efficiency and renewable energy applications.


Learn more about NREL's power electronics and electric machines research.


Impact of Accelerated Stress-Tests on SiC MOSFET Precursor Parameters, NREL Technical Report (2023)

Trends in SiC MOSFET Threshold Voltage and ON-Resistance Measurements From Thermal Cycling and Electrical Switching Stresses, NREL Technical Report (2023)

Evaluation of Low-Pressure-Sintered Multi-Layer Substrates for Medium Voltage SiC Power Modules, NREL Technical Report (2023)


Douglas DeVoto

Research Engineer