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Wide-Bandgap MOSFET Research with Virginia Tech Graduate Students

Along with graduate student fellows from Virginia Tech, NREL is researching aspects related to the reliability and prognostics of power electronic devices, particularly wide bandgap-based, metal-oxide semiconductor field-effect transistors (MOSFETs).

Photo of a male researcher holding a plastic bottle that he's squeezing to apply a liquid on a plate below lab equipment.

NREL and Virginia Tech are performing power cycling of emerging wide-bandgap devices. We are looking at electrical precursor measurements to indicate or predict remaining life of the device. These precursors change values when subjected to power cycling, and the change in precursor value is an indicator of remaining useful life.  In the near future, the technique could be applied to other power electronic components beyond the power devices.

The research supports training of graduate students and next generation of researchers with support from the U.S. Department of Energy Advanced Manufacturing Office (AMO). Learn more about AMO.

Impact

Prognostics and health management techniques can help in cost reductions and improve reliability for electric drive vehicles and other energy efficiency and renewable energy applications.

Capabilities

Learn more about NREL's power electronics and electric machines research.