In a fraction of a second, the photovoltaic (PV) Reflectometer measures the reflectance spectrum of a wafer or cell that is dimensionally within 6 in. × 6 in. The measured reflectance plots are deconvolved to derive physical parameters including surface roughness and texture, antireflective coating thickness, metallization area and height, and backside metallization properties.
Other Measurements pages:
For additional information contact Dean Levi, 303-384-6605.