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Dr. Peter Rupnowski, as a scientist in NREL’s Chemistry and Nanoscience Center, develops novel, high-speed, high-resolution, inline-compatible, nondestructive techniques for diagnostic and monitoring applications that focus on advanced energy materials used in low- and high-temperature fuel cells and Li-ion batteries. The techniques include hyper-spectral and thermal imaging for web-lines conveyed through roll-to-roll systems and active thermography for detection of electrolyte shorts and fatal cracks in ceramic parts.

In his previous assignment at Dow Corning and NREL, Peter worked on developing novel crystal growth techniques and led electro-optical and defect characterization activities for novel experimental silicon wafers and solar cells.

Dr. Rupnowski is co-recipient of a 2011 R&D 100 award and has co-authored two issued U.S. patents, 15 journal articles, and 44 conference publications.

Research Interests

  • Low- and high-temperature fuel cells
  • Li-ion batteries
  • Development of high-speed, in-line diagnostic techniques
  • Optical testing of web-line materials
  • Thermography


Ph.D. Materials Science, University of Denver, Denver, CO

M.S. Mechanical Engineering, Wroclaw University of Technology, Wroclaw, Poland

Featured Work

On-Line, Continuous Monitoring in Solar Cell and Fuel Cell Manufacturing Using Spectral Reflectance Imaging, US Patent (2016)

High Throughput and High Resolution In-Line Monitoring of PEMFC Materials by Means of Visible Light Diffuse Reflectance Imaging and Computer Vision, ASME 13th International Conference on Fuel Cell Science, Engineering and Technology (2015)

Wafer Screening Device and Methods for Wafer Screening, US Patent (2014)

Optical Techniques for Monitoring Continuous Manufacturing of Proton Exchange Membrane Fuel Cell Components, US Patent Application (2012)

Strength of Silicon Wafers: Fracture Mechanics Approach, International Journal of Fracture (2009)

Strength of Si Wafers with Microcracks: A Theoretical Model, Photovoltaic Specialists Conference, PVSC’08, 33rd IEEE (2008)

View all NREL publications for Peter Rupnowski.