Backscattered Diffraction for Crystalline Specimen Assessment
NREL has found electron backscattered diffraction (EBSD) to be a valuable tool for assessing crystalline specimens.
How It Works
EBSD is becoming an established, fully automated mode that indexes electron diffraction patterns produced by backscattered electrons under diffraction conditions.
EBSD generates maps of the orientation of crystalline phases and can be used to investigate misorientation between grain boundaries, texture, grain distribution, deformation, strain, and other properties. The ultimate resolution of EBSD is about 10-20 nanometers.