On staff since: 2000
Phone number: 303-384-6621
Email David Young
Primary Research Interests
- Electronic defect characterization
- Solar cell device physics and characterization
- Film silicon and III-V solar cell design
- IEEE, Member
- American Physical Society, Member
- Colorado Renewable Energy Society, Member
Prior Work Experience
- Los Alamos National Laboratory (P3) (1986, 1987)
- High school physics teacher (1989–1996)
- GRA National Renewable Energy Laboratory (1997–2000)
- Ph.D. in Applied Physics, Colorado School of Mines, Golden, CO (1996–2000)
- M.S. in Physics, Indiana University, Bloomington, IN (1987–1989)
- B.S. in Physics, Greenville College, Greenville, IL (1983–1987)
Hobbies and Other Interests
- Wood working
- Mountain biking
Young, D.L., J.V. Li, C.W. Teplin, P. Stradins, and H.M. Branz. "Junction transport in epitaxial film silicon heterojunction solar cells," Abstract 950, in IEEE PVSC. 2011. Seattle, WA.
Alberi, K., I.T. Martin, M. Shub, C.W. Teplin, Manuel J. Romero, R.C. Reedy, E. Iwaniczko, A. Duda, P. Stradins, H.M. Branz, and D.L. Young, "Material quality requirements for efficient epitaxial film silicon solar cells," Appl. Phys. Lett. 96 2010, p. 073502.
Liu, F.; Jones, K. M.; Xu, Y.; Nemeth, W.; Lohr, J.; Neilson, J.; Romero, M. J.; Al-Jassim, M. M.; Young, D. L. (2009). Ultrahigh-Crystalline-Quality Silicon Pillars Formed by Millimeter-Wave Annealing of Amorphous Silicon on Glass. Advanced Materials 21(29), 2009; pp. 3002-3006; NREL Report No. JA-520-46618.
Young D.L., B. Egaas, S. Pinegar, and P. Stradins, A new real-time quantum efficiency measurement system. 33rd IEEE PVSC, San Diego, CA, 2008, Paper 378
Young, D.L., D.L. Williamson, P. Stradins, Y. Xu, L. Gedvilas, E. Iwaniczko, Y. Yan, H. Branz, and Q. Wang, Nanostructure evolution in hydrogenated amorphous silicon during hydrogen effusion and crystallization. Applied Physics Letters, 2007. 90: p. 081923.
Young, D.L., T.J. Coutts, and V.I. Kaydanov, Density-of-States Effective Mass and Scattering Parameter Measurements by Transport Phenomena in Thin Films. Review of Scientific Instruments, 2000. 71(2): p. 462-466.