David Young

Senior Scientist
On staff since: 2000

Phone number: 303-384-6621
Email David Young

Primary Research Interests

• Electronic defect characterization
• Transport properties in thin films
• Film silicon solar cells

Other Affiliations

• Materials Research Society, Member
• American Physical, Member
• Colorado Renewable Energy Society, Member

Prior Work Experience

• Summer internships at Los Alamos National Laboratory (P3) (1986,1987)
• High school physics teacher (1989-1996)
• GRA National Renewable Energy Laboratory (1997-2000)

Education

• Ph.D. in Applied Physics, Colorado School of Mines, Golden, CO (1996-2000)
• M.S. in Physics, Indiana University, Bloomington, IN (1987-1989)
• B.S. in Physics, Greenville College, Greenville, IL (1983-1987)

Hobbies and Other Interests

• Wood working
• Mountain biking with my wife, Glo
• Playing with my two sons, Michael and Napayshni
• Music

Selected Publications

Young D.L., B. Egaas, S. Pinegar, and P. Stradins, A new real-time quantum efficiency measurement system. 33^rd IEEE PVSC, San Diego, CA, 2008, Paper 378.

Young, D.L., D.L. Williamson, P. Stradins, Y. Xu, L. Gedvilas, E. Iwaniczko, Y. Yan, H. Branz, and Q. Wang, Nanostructure evolution in hydrogenated amorphous silicon during hydrogen effusion and crystallization. Applied Physics Letters, 2007. 90: p. 081923.

Young, D.L., D.L. Williamson, P. Stradins, Y. Xu, L. Gedvilas, A.H. Mahan, H. Branz, and Q. Wang, Rapid solid phase crystallization of high-rate, hot-wire chemical-vapor-deposition hydrogenated amorphous silicon. Applied Physics Letters, 2006. 89: p. 161910.

Young, D.L. and R.S. Crandall, Strongly temperature-dependent free-energy barriers measured in a polycrystalline semiconductor. Applied Physics Letters, 2005. 86: p. 262107.

Young, D.L., J.F. Geisz, and T.J. Coutts, Nitrogen-induced decrease of the electron effective mass in GaAs1-xNx thin films measured by thermomagnetic transport phenomena. Appl. Phys. Lett., 2003. 82(8): p. 1236-1238.

Young, D.L., T.J. Coutts, and V.I. Kaydanov, Density-of-States Effective Mass and Scattering Parameter Measurements by Transport Phenomena in Thin Films. Review of Scientific Instruments, 2000. 71(2): p. 462-466.

View a complete list of my NREL publications.