Senior Scientist
On staff since: 2000
Phone number: 303-384-6621
Email David Young
Primary Research Interests
- Electronic defect characterization
- Solar cell device physics and characterization
- Film silicon and III-V solar cell design
Other Affiliations
- Materials Research Society, Member
- American Physical Society, Member
- Colorado Renewable Energy Society, Member
Prior Work Experience
- Summer internships at Los Alamos National Laboratory (P3) (1986, 1987)
- High school physics teacher (1989–1996)
- GRA National Renewable Energy Laboratory (1997–2000)
Education
- Ph.D. in Applied Physics, Colorado School of Mines, Golden, CO (1996–2000)
- M.S. in Physics, Indiana University, Bloomington, IN (1987–1989)
- B.S. in Physics, Greenville College, Greenville, IL (1983–1987)
Hobbies and Other Interests
- Wood working
- Mountain biking with my wife, Glo
- Playing with my two sons, Michael and Napayshni, and daughter, Kate
- Music
Selected Publications
Liu, F.; Jones, K. M.; Xu, Y.; Nemeth, W.; Lohr, J.; Neilson, J.; Romero, M. J.; Al-Jassim, M. M.; Young, D. L. (2009). Ultrahigh-Crystalline-Quality Silicon Pillars Formed by Millimeter-Wave Annealing of Amorphous Silicon on Glass. Advanced Materials. Vol. 21(29), 2009; pp. 3002-3006; NREL Report No. JA-520-46618.
Young D.L., B. Egaas, S. Pinegar, and P. Stradins, A new real-time quantum efficiency measurement system. 33rd IEEE PVSC, San Diego, CA, 2008, Paper 378
Young, D.L., D.L. Williamson, P. Stradins, Y. Xu, L. Gedvilas, E. Iwaniczko, Y. Yan, H. Branz, and Q. Wang, Nanostructure evolution in hydrogenated amorphous silicon during hydrogen effusion and crystallization. Applied Physics Letters, 2007. 90: p. 081923.
Young, D.L. and R.S. Crandall, Strongly temperature-dependent free-energy barriers measured in a polycrystalline semiconductor. Applied Physics Letters, 2005. 86: p. 262107.
Young, D.L., J.F. Geisz, and T.J. Coutts, Nitrogen-induced decrease of the electron effective mass in GaAs1-xNx thin films measured by thermomagnetic transport phenomena. Appl. Phys. Lett., 2003. 82(8): p. 1236-1238.
Young, D.L., T.J. Coutts, and V.I. Kaydanov, Density-of-States Effective Mass and Scattering Parameter Measurements by Transport Phenomena in Thin Films. Review of Scientific Instruments, 2000. 71(2): p. 462-466.
View a complete list of my NREL publications. |
