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David Bobela

Postdoctoral Researcher
On staff since: 2008

Phone number: 303-384-7824
Email David Bobela

Primary Research Interests

  • Metastable phenomena in amorphous semiconductors
  • Relationship between atomic structure and electrical / optical properties
  • Magnetic resonance techniques

Other Affiliations

  • American Physical Society
  • Materials Research Society

Education and Background Training

  • Ph.D. (2008) in Physics, University of Utah, Salt Lake City, UT
  • M.S. (2005) in Physics, University of Utah, Salt Lake City, UT
  • B.S. (2002) in Physics, Saint Michael's College, Colchester, VT

Hobbies and Other Interests

  • Skiing (serious Tele habit), cycling, and most other outdoors sports
  • Juggling, slack-lining, skeet and trap shooting
  • Laughing, hanging out with family and friends

Selected Publications

Su, T.; Taylor, P.C.; Ganguly, G.; Carlson, D.E.; Bobela, D.C.; Hari, P. (2007). 1H NMR Electron-Nuclear Cross Relaxation in Thin Films of Hydrogenated Amorphous Silicon, Phys. Rev. B. 76, 245209.

Bobela, D.C.; Taylor, P.C. (2006). Quadrupole and Chemical Shift Interactions in Crystalline and Amorphous Chalcogenides, J. Opelect. and Adv. Mats. 8, 2051.

Bobela, D.C.; Taylor, P.C.; Madan, A.; Ganguly, G. (2006). The Concentration of (SiH2)n Sites in Low and High Defect Density a-Si:H, Mater. Res. Soc. Symp. Proc. 910, 910.

Bobela, D.C.; Su, T.; Taylor, P.C.; Ganguly, G. (2006). Microscopic Properties of Silicon Dihydride Bonding in a-Si:H, J. Non Cryst. Sols. 352, 1041.

Karstens, W.; Bobela, D.C.; Smith, D. (2006). Impurity and Free-Carrier Effects on the Far-Infrared Dispersion Spectrum of Silicon, J. Opt. Soc. Am. A. 23, 723.

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