Research Staff

A group of 15 men and women stand on the landing of a building that has a glass front.

Experienced scientists, engineers, and technicians lend their expertise as members of the Photovoltaic Reliability Group at NREL.

Our group is founded on the expertise and interaction of talented individuals.

Members of the group have diverse backgrounds in physics, engineering, chemistry, building design, remote sensing, electrical design, and materials science.

Nick Bosco
Chris Deline
Steve Glick
Peter Hacke
Dirk Jordan
Mike Kempe
Sarah Kurtz, Reliability Group Manager
Bill Marion
David Miller
Matt Muller
Greg Perrin
Jose Rodriguez
Bill Sekulic
Timothy Silverman
Ryan Smith
Kent Terwilliger
John Wohlgemuth, Project Leader

Infrared image of Nick Bosco

Nick Bosco, PhD, Senior Scientist

OTF/204, 303-384-6337

Task Focus:

Failure Analysis and Accelerated Testing

Specializes in:

Infrared imaging and other diagnostic techniques; analysis and development of accelerated test for concentrating photovoltaic (CPV) die attach.

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Chris Deline

Chris Deline, PhD, Engineer

OTF/209-02, 303-384-6359

Task Focus:

PV Module and System Performance

Specializes in:

Modeling and analysis of modules under shaded or partially degraded conditions.

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Steve worked with a team of researchers to set up the 5-chamber PECVD system in SERF/W213.

Steve Glick, Scientist

OTF/104, 303-384-6650

Task Focus:

Electroluminescent, infrared, and visual imaging of PV modules

Specializes in:

Materials science of photovoltaic module materials.

Known for:

Material deposition of thin-film moisture barriers; alternative encapsulant formulations development; reliability and encapsulant performance studies related to photothermal degradation.

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Peter Hacke, PhD

Peter Hacke, PhD, Senior Scientist

OTF/206, 303-384-6668

Task Focus:

Accelerated Testing of PV Modules

Specializes in:

Failure analysis and use of accelerated testing to make long-term predictions about module performance.

Known for:

Work on potential-induced degradation of crystalline silicon modules.

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Dirk Jordan, PhD

Dirk Jordan, PhD, Senior Reliability Engineer

OTF/203, 303-384-6762

Task Focus:

Evaluation of Outdoor Module Performance Data

Specializes in:

Analysis of module performance data to quantify module degradation rates.

Known for:

Statistical analysis of reported degradation rates of PV modules.

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Mike places samples in an environmental chamber to determine the effect of humidity on polymer adhesion.

Mike Kempe, PhD, Scientist

SERF E-100-50, 303-384-6325

Task Focus:

PV Module Packaging R&D

Specializes in:

Coordinating and performing materials durability testing.

Known for:

Interest in the role of polymer chemistry and physics in module degradation; lap-shear, water-vapor transmission, and water-solubility testing of encapsulants; using results in finite element analysis to determine length of time it takes for water to enter a module.

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Sarah Kurtz

Sarah Kurtz, PhD, Principal Scientist, Reliability Group Manager

SERF/W107, 303-384-6475

Task focus:

PV Reliability Project management and standards development, especially for CPV.

Known for:

Developing multijunction concentrator cells and supporting the CPV industry.

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Bill works on systems performance modeling, shown on the computer screen behind him.

Bill Marion, Principal Scientist

OTF/202-01, 303-384-6793

Task Focus:

Module/System Technology Testing and Validation

Specializes in:

Solar Radiation Resource Information and PV module and system performance modeling.

Known for:

Advanced capability in PV modeling; IV curve translations.

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David in front of environmental chamber used to perform accelerated aging on reflective (shown) and transmissive components of traditional and concentrating solar equipment.

David Miller, PhD, Scientist

OTF/108-05, 303-384-7855

Task Focus:

Accelerated Testing and Failure Analysis of Photovoltaic Components and Modules

Specializes in:

Materials characterization for reliability and lifetime assessment. Current activities include: "optical side" of CPV, including materials for encapsulation and optical components (lenses); encapsulation materials for conventional flat-plate PV, including crystalline-Si and thin-film technologies; reliability of thin-film PV, including transparent conductive oxide and active device layers.

Known for:

Characterization and reliability assessment of micro- and nanomaterials. Past studies include: mechanical robustness of nanoscale thick films, deposited by atomic layer deposition (ALD) and molecular layer deposition (MLD), for chemical permeation barrier applications; galvanic corrosion in Si/metal systems for microelectromechanical systems (MEMS) applications; mechanical properties of nanowire materials; thermo-mechanical reliability of Au/Si system for optical MEMS applications. Background in mechanical engineering with emphasis on materials science.

View NREL publications for this staff member.