Stand-Alone Measurements and Characterization Capabilities
The Stand-Alone Measurements and Characterization (M&C) tools in the Process Development and Integration Laboratory offer powerful capabilities for measuring and characterizing photovoltaic materials and devices. Contact Pete Sheldon or other contacts listed on specific tool pages for more details on these capabilities.
Basic Stand-Alone M&C Capabilities
Measurements and Characterization
- Lock-in thermography imaging workstation
- Photoluminescence and electroluminescence imaging workstation
- n&k analyzer
- Large-area photoemission tool
- Semilab tool
- Scanning electron microscopy tool
- Photothermal deflection spectroscopy tool
- Scanning probe microscopy tool
- Reflectometer diagnostic tool
- Rutherford backscattering spectrometry tool (not shown in schematic; located in Bay 0 of PDIL)
- Optical processing furnace—also called the optical thermal annealing station
- Silicon wafer preparation workstation
The figure shows where the tools or techniques—numbered in the list above—that make up the Stand-Alone Measurements and Characterization suite are located within several bays in the Process Development and Integration Laboratory.
Other Measurements and Characterization Capabilities
The capabilities of the Stand-Alone Measurements and Characterization tool suite are supplemented by the Integrated Measurements and Characterization cluster tool within Bay 6 of the Process Development and Integration Laboratory. Samples from the Stand-Alone Measurements and Characterization tool suite can be transported to the Integrated Measurements and Characterization cluster tool using the mobile transport pod, which can keep samples under vacuum conditions. View a short animated video that explains seven terms related to sample measurements in the PDIL.
Other stand-alone measurements and characterization capabilities exist within the National Center for Photovoltaics, but are located in laboratories outside the PDIL. These capabilities can be found on the NREL Measurements and Characterization Web site.