Measurements and Characterization in the Atmospheric Processing Platform
X-ray fluorescence unit in the Atmospheric Processing platform.
This page provides details on measurements and characterization in the Atmospheric Processing platform. The two techniques highlighted are X-ray fluorescence (XRF) and X-ray diffraction (XRD).
X-Ray Fluorescence Tool
The XRF tool has high throughput and is capable of handling large-area (157-mm x 157-mm) samples. This unit exhibits low scatter of X-rays in air, thereby yielding a good signal-to-noise ratio. For more information, contact Phil Parilla.
Applications:
- Analyzing material composition
- Mapping elemental composition across samples
Special features:
- Quantitative range is Na and higher; qualitative results for N, O, Fl
- Uses a video alignment and pointing system
- Located in a glove box, with He as an inert gas
Analytical X-Ray Diffraction Tool
The XRD tool has high throughput and can handle large-area (157-mm x 157-mm) samples. Like the XRF tool, this unit exhibits low scatter of X-rays in air, thereby yielding a good signal-to-noise ratio. For more information, contact Phil Parilla.
X-ray diffraction unit in the Atmospheric Processing platform. Detector not shown.
Applications:
- Analyzing the structure of a material
- Mapping the crystalline-phase composition across samples
Special features:
- Uses a video alignment and pointing system
- Located in a glove box, with He as an inert gas
