Skip to main content

Measurements and Characterization in the Atmospheric Processing Platform

Photo of box-like unit sitting on a surface. A small card version of the Periodic Table is on the table, in front of the open side of the unit. The unit is labeled as "Solar Metrology, System SMX."

X-ray fluorescence unit in the Atmospheric Processing platform.

This page provides details on measurements and characterization in the Atmospheric Processing platform. The two techniques highlighted are X-ray fluorescence (XRF) and X-ray diffraction (XRD).

X-Ray Fluorescence Tool

The XRF tool has high throughput and is capable of handling large-area (157-mm x 157-mm) samples. This unit exhibits low scatter of X-rays in air, thereby yielding a good signal-to-noise ratio. For more information, contact Phil Parilla.

Applications:

  • Analyzing material composition
  • Mapping elemental composition across samples

Special features:

  • Quantitative range is Na and higher; qualitative results for N, O, Fl
  • Uses a video alignment and pointing system
  • Located in a glove box, with He as an inert gas

Analytical X-Ray Diffraction Tool

The XRD tool has high throughput and can handle large-area (157-mm x 157-mm) samples. Like the XRF tool, this unit exhibits low scatter of X-rays in air, thereby yielding a good signal-to-noise ratio. For more information, contact Phil Parilla.

Photo of the inside of of spherical metal chamber. Sample is held in holder in middle of the chamber. X-ray source is to the upper right in the chamber. Everything is mounted on a circular stage.

X-ray diffraction unit in the Atmospheric Processing platform. Detector not shown.

Applications:

  • Analyzing the structure of a material
  • Mapping the crystalline-phase composition across samples

Special features:

  • Uses a video alignment and pointing system
  • Located in a glove box, with He as an inert gas