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Fourier-Transform Infrared and Raman Spectroscopy

Image of FTIR map

FTIR mapping capabilities are extremely useful for the quick, nondestructive characterization of heterogeneous free carrier properties of transparent conduction oxides.

Infrared spectroscopy is a nondestructive, highly sensitive technique that provides information about impurities, chemical environment, and free-carrier properties. Performing both Fourier transform (FT)-Raman and Fourier transform infrared (FTIR) spectroscopy on a sample gives a complete picture of its bonding structure. Both techniques benefit from high FT sensitivity and can be used with database searches of our extensive libraries of FTIR and FT-Raman spectra to chemically identify samples and sample components.


Compositional Analysis and Contaminant Identification

Measurement of the reflectance and transmittance of infrared radiation reveals signature spectroscopic peaks allowing identification of elemental and molecular constituents within organic and inorganic compounds. Quantitative compositional information is available with suitable standards.

Free Carrier Properties of Semiconductor Materials

The measurement of infrared free-carrier reflectance and transmittance provides a non-contact means to monitor the conductivity of a sample through its free-carrier density.

Microprobe and Mapping of Heterogeneities

Microscope accessories allow small spot (2 to 50 µm) analysis of material properties. Additionally, mapping capabilities (up to 8-inch diameter) are available for some techniques. These are utilized in the investigation of sample heterogeneity. Examples include small spot contaminant identification and large area sample uniformity.

For additional information contact Dean Levi, 303-384-6605.