MIDC/AIM Calibration Database
Total Records: 1, displaying 1-1

R#Serial NumberCalibration FacilityCalibration DateDate for next CalibrationResponsivity [45]Responsivity [45:55]Responsivity [Comp]Calibration Factor [45]Instrument::MakeInstrument::ModelInstrument::DescriptionInstrument::ProgramInstrument::Factory CalibrationInstrument::Date of Factory CalibrationResponsivity Bins [2 deg]Responsivity Bins [9 deg]Responsivity Function CoefficientsOther CalibrationsCalibration FileContact PersonDocumentation TitleCalibration MethodCalibration NotesOther InformationDatalogger Entry DateResponsivity [45] [Corr]Calibration Factor [45] [Corr]Responsivity [45:55] [Corr]Responsivity [Comp] [Corr]Correction Method
1S94121.04NREL/Optics Lab08/01/199908/01/2000CF: (675nm)=0.17684; (778nm)=0.13943 W/mē/nm/mVVo: (368nm)=7.57; (500nm)=8.77; (675nm)=8.45; (778nm)=8.51 mVCF: (368nm)=0.14413; (500nm)=0.21767 W/mē/nm/mVEKOMS-110PhotometerNREL/ProgramDaryl MyersBrett Holmberg's Calibration ReportLangley Plot11/01/2000