R# | Serial Number | Calibration Facility | Calibration Date | Date for next Calibration | Responsivity [45] | Calibration Factor [45] | Instrument::Make | Instrument::Model | Instrument::Description | Instrument::Program | Instrument::Factory Calibration | Instrument::Date of Factory Calibration | Responsivity Bins [2 deg] | Responsivity Function Coefficients | Other Calibrations | Calibration File | Contact Person | Documentation Title | Calibration Method | Calibration Notes | Other Information | Datalogger Entry Date | Responsivity [45] [Corr] | Calibration Factor [45] [Corr] | Correction Method | Responsivity Bins Average [2 deg] |
---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
1 | S94121.04 | NREL/Optics Lab | 08/01/1999 | 08/01/2000 | CF: (675nm)=0.17684; (778nm)=0.13943 W/mē/nm/mV | CF: (368nm)=0.14413; (500nm)=0.21767 W/mē/nm/mV | EKO | MS-110 | Photometer | NREL/Program | Daryl Myers | Brett Holmberg's Calibration Report | Langley Plot | 11/01/2000 |