PIX number

14516

Title:

Analytical Microscopy

Caption

The F20 microscope is used to investigate microstructure, defect, chemical composition and electronic structure in advanced semiconductors. The microscope offers capabilities of atomic-resolution imaging, EDS, EELS and elemental mapping.

Credit:

Linenberger, Mike

Publications:



Date:

2/9/2006

Index Date:

3/6/2006

DOE_office:

Notes:

High resolution digital file, ~22,000KB

Subject:

solar-photovoltaics

Descriptors:

basic sciences, measurement, people and scientist, testing

Person/Place:

Yan, Yanfa; Golden, Colorado; NREL; SERF

Release Level

DOE Information:

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