PIX number

14503

Title:

SPM MultiProbe S

Caption

The SPM MultiProbe S, from Omicron Nano Technology has the capability to clean the sample surface in vacuum and deposit metals on the surface. Atomic Force Microscopy (contact, non-contact, tapping modes), Scanning Tunneling Microscopy, Scanning Kelvin Probe Microscopy in ultra-high-vacuum.

Credit:

Linenberger, Mike

Publications:



Date:

2/15/2006

Index Date:

3/6/2006

DOE_office:

Notes:

High resolution digital file. ~22,000KB

Subject:

solar-photovoltaics

Descriptors:

basic sciences, current, equipment, microscope, people and scientist, research, sample, staff, testing

Person/Place:

Jiang, Chun-Sheng; Golden, Colorado; NREL; SERF

Release Level

Full/Internet

DOE Information:

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