PIX number

14492

Title:

SPM Dimension 3100

Caption

The SPM 3100 from Veeco Metrology works in air and is capable of analyzing large area samples with the following techniques: Atomic Force Microscopy (contact, non-contact, tapping modes), Scanning Tunneling Microscopy, Scanning Kelvin Probe Microscopy, Conductive Atomic Force Microscopy and Scanning Capacitance Microscopy.

Credit:

Linenberger, Mike

Publications:



Date:

2/15/2006

Index Date:

3/6/2006

DOE_office:

Notes:

High resolution digital file. ~22,000KB

Subject:

solar-photovoltaics

Descriptors:

basic sciences, current, equipment, microscope, people and scientist, research, sample, staff, testing

Person/Place:

Moutinho, Helio; Golden, Colorado; NREL; SERF

Release Level

Full/Internet

DOE Information:

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