Proceedings

Proceedings from past events are listed below.

 

4th International PV Module Quality Assurance Forum, October 10, 2013

Thursday, October 10, 2013

To access these presentations, please sign in to Google docs.

Welcome—Takahiro Wada, Ryukoku University
Welcome—Tony Sample, JRC
Japan's FIT Program and PV Reliability Assurance—Eiji Yamada, JET
Differences between Qualification Tests, Comparative Tests and Service Life Predictions and How They Use Accelerated Stress Tests in Different Ways—John Wohlgemuth, NREL
Results of Field Tests in Japan—Hiroshi Kato, JET
Cutting Edge Quality Assurance for Technical Bankability VDE Quality Tested Program—Hideki Nishimura, VDE
Accelerated Degradation Test for Commercial PV Modules—Shinji Kawai, SAGA-ITC
PV+ Test—Jörg Althaus, TUV Rheinland
Task Group 1: Progress Report—Yoshihito Eguchi, JET
Thermal Runaway Test for Bypass Diode—Y. Uchida, JET
Status of Task Gr. 8: Region Japan—Keizo Asaoka, Kaneka Corporation
Proposal for Comparative PV Module Rating System—John Wohlgemuth, NREL

 

International PV Module QA Task Force, Thin Film Task Group, Kick Off Meeting

Thursday February 28, 2013
Introduction QA Task Force Thin-Film Workshop—John Wohlgemuth and Sarah Kurtz, National Renewable Energy Laboratory (NREL)

Summary of Activities for Task Groups 2–5. Session Chairs were Veronica Bermudez, NEXCIS, and Sarah Kurtz, NREL.

Discussion: Thin-Film Summary of Failures—Veronica Bermudez, NEXCIS, and Sarah Kurtz, NREL

Field Experience with Thin-Film Modules and Packaging Materials: ID Failure Modes. Session chairs were Neelkanth Dhere, Florida Solar Energy Center (FSEC), and Ryan Gaston, Dow Chemical Company.

Discussion: Shared Field Experience with Thin-Film Modules—Neelkanth Dhere, FSEC, and Ryan Gaston, Dow Chemical Company

Accelerated Testing Experience with Thin-Film Modules and Materials: ID Failure Modes and Correlation with Field Results. Session chairs were Kurt Scott, Atlas Material Testing Technology, and David Burns, 3M.

Discussion: Which accelerated stress tests have been useful for particular thin-film constructions? Kurt Scott, Atlas Material Testing Technology, and David Burns, 3M

Friday March 1, 2013
Breakout Sessions

 

Regional Meeting of the International PV Module Quality Assurance Forum

February 26–27, 2013
A regional meeting as part of NREL's annual Photovoltaic Module Reliability Workshop (PVMRW) was held for the Americas. The meeting agenda and presentations are available on the EERE website.

 

3rd International PV Module Quality Assurance Forum

November 27, 2012
The meeting agenda and presentations are available on the AIST website.

 

Regional Meeting of the International PV Module Quality Assurance Forum

February 29, 2012
A regional meeting was held in the Americas as a subset of NREL's PVMRW.
The meeting agenda and presentations are available on the EERE website.

 

2nd International PV Module Quality Assurance Forum

December 7–8, 2011
The meeting agenda and presentations are available on the AIST website.

 

International PV Module QA Forum Meeting

September 8, 2011
Hamburg, Germany
During the meeting, the results from the July forum were reviewed, and the current status summarized.

 

International PV Module Quality Assurance Forum

July 15–16, 2011
San Francisco, California
The proceedings include presentations from the International PV Module Quality Assurance Forum, July 15–16, 2011, San Francisco, CA are provided below. A second 2nd PV Module QA Forum Meeting was held in Tokyo, Dec. 7–8, 2011.

The final agenda is also available.

Session I. Defining the Need — The Importance of Quality Assurance

Session chairs: Michio Kondo (AIST), Sarah Kurtz (NREL)

Session II. Existing Standards — What They Do and Don't Do

Session chairs: David Degraaff (SunPower), Masaaki Yamamichi (AIST)

Session III. Regional and Application-Specific Requirements

Session chairs: Tony Tang (Suntech), Danny Cunningham (BPSolar)

Session IV. Proposed New Tests

Session chairs: Yoichi Murakami (JET), Michael Koehl (Fraunhofer, ISE)

Session V. Proposals for Manufacturing QA Guideline and QA Rating Methodology

Session chairs: Tony Sample (EC JRC), Govindasamy Tamizhmani (TUV)

Session VI. Prioritization of Failure/Degradation Mechanisms

Session chairs: Dan Doble (Fraunhofer CSE), Gerhard Kleiss (SolarWorld)

Next Steps and Forum Statement, John Wohlgemuth (NREL)

Closing Remarks, AIST and NREL